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Ellipsometry is a self-referencing technique that does not require reference samples to maintain accuracy. Samples smaller than the beam diameter can be measured because the entire beam does not need to be collected. Highly Accurate Measurement The VASE is able to collect the most accurate data of any ellipsometer through its use of our patented AutoRetarder. The AutoRetarder adjusts the polarization state of the incident measurement beam to provide optimal sensitivity for all types of materials. This provides an optimum measurement for any sample, under any conditions. Local residents are increasingly concerned about what more industrial plans will mean for their community (Image: Liverpool Echo) The AutoRetarder is a computer controlled MgF 2 Berek waveplate (compensator) used to accurately introduce retardance into the beam path. Because the compensator is under computer control, it is possible to generate appropriate retardance values (0 – 90°) over a broad (140 – 2500 nm) spectral range. The retardance is automatically adjusted to give the highest measurement accuracy for any sample. Quantum Design UK and Ireland and J A Woollam Inc would like to involve as many users as possible to show the latest CompleteEase software capability and advances that have been made. Lunch and refreshments will be provided.

Ellipsometry is highly sensitive to surface roughness and oxide layers that natively grow on most semiconductors. In addition, optical bandgap, electronic transitions, and critical points can be determined for bulk and thin-film semiconductor materials such as GaN, InP, SiGe, CdTe, etc. Crystallinity and alloy composition can also be determined by monitoring the shape and wavelength position of the critical points. Liquid Studies Gary is a founding member of the newly formed Garston Community United group, which was set up to fight for a part of the city that many around here feel has been totally forgotten about.New achromatic compensator design with optimized performance over a wide spectral range. *patent pending Wide Spectral Range In addition to being a very effective standalone tool for thermomicrometric sample analysis, Linkam stages are often used to add temperature and environmental control to a range of complimentary techniques, from fluorescence microscopy to Raman spectroscopy, and from X-ray diffraction to ellipsometry. Each of these techniques requires careful experimental planning to ensure that the sample can be analysed correctly with the two devices working in unison, and at Linkam we regularly work with other instrument manufacturers to provide the market-leading temperature control solution across all of these techniques. Here, we take a deeper look at one technique in particular – ellipsometry – and how our collaboration with ellipsometry experts J.A. Woollam enables precision temperature and environmental control with a range of Woollam ellipsometers.

Maxwell’s equations must remain satisfied when light interacts with a material, which leads to boundary conditions at the interface. Incident light will reflect and refract at the interface, as shown in the figure below. The angle between the incident ray and sample normal (θ i) will be equal to the reflected angle, (θ r). Light entering the material is refracted at an angle θ t given by:CompleteEASE is the perfect interface for real-time data acquisition, monitoring, and control. It leverages the vast in-situ spectroscopic ellipsometry experience at She adds: "The community there have often felt that they are the forgotten ones in this part of South Liverpool when it comes to getting community development and improvements in their area and I am determined to do all I can to help improve this part of my constituency and ensure that any industrial developments in the area have a benefit for the community in which they are based.” Wavelength range…both the number and range of wavelengths that can be measured are important factors for how well an ellipsometer can solve thin film measurement problems. The RC2 is the first commercial spectroscopic ellipsometer to collect all 16 elements of the Mueller matrix. Mueller matrix SE allows characterization of the most advanced samples and nanostructures. Best Measurement Accuracy

Spectroscopic ellipsometry measurements determine the change in polarization for a light beam reflecting or transmitting from a surface. If the measurement system and sample are ideal, the incoming and detected light are both fully polarized. However, real-world measurement systems and samples can cause some of the light to become unpolarized. Depolarization describes the percentage of light that has become unpolarized. We offer a variety of sample stage mounts to accommodate your measurement needs. Our standard and small sample stages are provided with every ellipsometer, while the others are available as upgrades. Options include:

ANISOTROPY APPLICATIONS

Accuracy…the measurement precision and accuracy for most ellipsometers far exceeds the typical need of users. For example, the precision of gate oxide measurements is often 0.003nm or better. Analyzing in-situ ellipsometry data is made simple in CompleteEASE. Often the best way to interpret and analyze changes observed in real-time is by using the multi-time-slice analysis mode. This approach allows users to distinguish model parameters that vary with time from other parameters which are constant as a function of SE measurements calculate the change in polarization of light. For real-time measurements, this has significant advantages over intensity-based measurements: Phase transitions and transition temperatures can also be observed by monitoring temperature-dependent optical properties. J. A. Woollam customises its ellipsometers according to the needs of individual users, for example by integrating temperature-controlled modules. This is particularly important during the R&D process so researchers can better understand how their materials behave as a function of temperature. Jeremy Van Derslice, of Woollam’s Applications Group, describes the considerations this requires: “When our customers are using ellipsometry for R&D, they themselves are usually working on something brand new, often requiring uniquely configured instrumentation. We do our best to accommodate customisation requests from our customers and have built a business around that concept.”